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KEOD is part of IC3K, the International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management
Registration to KEOD allows free access to all other IC3K conferences

Knowledge Engineering (KE) refers to all technical, scientific and social as-pects involved in building, maintaining and using knowledge-based systems. KE is a multidisciplinary field, bringing in concepts and methods from several computer science domains such as artificial intelligence, databases, expert systems, decision support systems and geographic information systems.
Ontology Development (OD) aims at building reusable semantic structures that can be informal vocabularies, catalogs, glossaries as well as more complex finite formal structures representing the entities within a domain and the relationships between those entities. Ontologies, have been gaining interest and acceptance in computational audiences: formal ontologies are a form of software, thus software development methodologies can be adapted to serve ontology development. A wide range of applications is emerging, especially given the current web emphasis, including library science, ontology-enhanced search, e-commerce and business process design.


Jan DietzComputer Science, Delft University of Technology, Netherlands


Daniel O'LearyMarshall, University of Southern California, United States
Sophia AnaniadouUniversity of Manchester, United Kingdom
Alfred InselbergSchool of Mathematical Sciences, Tel Aviv University, Israel
Peter F. Patel-SchneiderIndependent Researcher, United States
Florian MichahellesSwitzerland

A short list of presented papers will be selected
so that revised and extended versions of
these papers will be published by
Springer-Verlag in a CCIS Series book

A short list of papers presented
at the KEOD conference will be
selected for publication of extended
and revised versions in a special issue
of the Wiley Journal "Intelligent
Systems in Accounting, Finance
and Management"

In Cooperation with:


Proceedings will be submitted for indexation by:

Thomson   INSPEC   DBLP   EI